Reasonable Royalties, Apportionment, and Overseas Profits: Assessing Patent Damages

New York, NY
13 November 2019
Hosted By: New York Intellectual Property Law Association

Managing Director Dr. Christine Siegwarth Meyer will speak at the NYIPLA One-Day Patent CLE Seminar on the panel titled “Reasonable Royalties, Apportionment, and Overseas Profits: Assessing Patent Damages.” Dr. Meyer and other panelists will address questions related to calculating damages in patent litigation while looking at recent Federal Circuit and Supreme Court decisions. 

To learn more about this seminar and to register, click here

To contact us about this event, please click here.